Scanning Stages for Inverse Microscope
The SCAN IM series has been developed especially for applications in inverse microscopes which require automatic and very exact sample positioning.
Enhanced by special adaptations, these microscope stages are perfectly in line with nearly all current inverted microscopes.
According to their designated range of application these systems can be optionally upgraded, for example with custom-designed stage inserts or Piezo-Z stages.
A special long-term lubrication system guarantees that specifications are maintained, even after a very long running perio
ball screw pitch