High sensitivity without damage
Some thin samples, such as 2D material, can be easily damaged by high density laser. With our system, users can measure high quality Raman & PL, without sample damage.
Analysis all kinds of carbon and 2D materials.
Basically, FEX provides Raman & PL measurement. And also, with variety accessories such as probe station, you can have wider range measuring function.
With probe station, we provide variety measurement solution. Photocurrent measurement, photoconductive and also mapping solution on the measurement.
Measure chemical information without using stain. And also, fluorescence imaging is possible using spectral mapping function.
LSPR measurement and micron & nano particle tracking (on request)
From micron scale to macro scale, our system provides you the solution